Investigation of the Casimir force between metal and semiconductor test bodies

Chen, F.; Mohideen, U.; Klimchitskaya, G. L.; Mostepanenko, V. M.

doi:10.1103/PhysRevA.72.020101

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Quantum Physics

Title: Investigation of the Casimir force between metal and semiconductor test bodies

Authors: F. Chen, U. Mohideen, G. L. Klimchitskaya, V. M. Mostepanenko

(Submitted on 1 May 2005 (v1), last revised 8 Jul 2005 (this version, v2))

Abstract: The measurement of the Casimir force between a large gold coated sphere and single crystal silicon plate is performed with an atomic force microscope. A rigorous statistical comparison of data with theory is done, without use of the concept of root-mean-square deviation, and excellent agreement is obtained. The Casimir force between metal and semiconductor is demonstrated to be significantly different than between two similar or dissimilar metals.

Comments:	9 pages, 3 figures; minor abbreviations in the text were made; accepted for publication in Phys. Rev. A (Rapid Communications)
Subjects:	Quantum Physics (quant-ph); Materials Science (cond-mat.mtrl-sci)
Journal reference:	Phys. Rev. A, v.72, 020101(R) (2005).
DOI:	10.1103/PhysRevA.72.020101
Cite as:	arXiv:quant-ph/0505003
	(or arXiv:quant-ph/0505003v2 for this version)

Submission history

From: Galina L. Klimchitskaya [view email]
[v1] Sun, 1 May 2005 08:41:37 GMT (180kb)
[v2] Fri, 8 Jul 2005 08:55:34 GMT (139kb)

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