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Statistics > Machine Learning

Title: Two-sample Testing Using Deep Learning

Abstract: We propose a two-sample testing procedure based on learned deep neural network representations. To this end, we define two test statistics that perform an asymptotic location test on data samples mapped onto a hidden layer. The tests are consistent and asymptotically control the type-1 error rate. Their test statistics can be evaluated in linear time (in the sample size). Suitable data representations are obtained in a data-driven way, by solving a supervised or unsupervised transfer-learning task on an auxiliary (potentially distinct) data set. If no auxiliary data is available, we split the data into two chunks: one for learning representations and one for computing the test statistic. In experiments on audio samples, natural images and three-dimensional neuroimaging data our tests yield significant decreases in type-2 error rate (up to 35 percentage points) compared to state-of-the-art two-sample tests such as kernel-methods and classifier two-sample tests.
Subjects: Machine Learning (stat.ML); Machine Learning (cs.LG); Methodology (stat.ME)
Cite as: arXiv:1910.06239 [stat.ML]
  (or arXiv:1910.06239v2 [stat.ML] for this version)

Submission history

From: Matthias Kirchler [view email]
[v1] Mon, 14 Oct 2019 16:16:58 GMT (687kb,D)
[v2] Tue, 10 Mar 2020 16:01:53 GMT (4263kb,D)

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