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Condensed Matter > Materials Science

Title: Suppressing dynamical diffraction artefacts in differential phase contrast scanning transmission electron microscopy of long-range electromagnetic fields via precession

Abstract: In differential phase contrast scanning transmission electron microscopy (DPC-STEM), variability in dynamical diffraction resulting from changes in sample thickness and local crystal orientation (due to sample bending) can produce contrast comparable to that arising from the long-range electromagnetic fields probed by this technique. Through simulation we explore the scale of these dynamical diffraction artefacts and introduce a metric for the magnitude of their confounding contribution to the contrast. We show that precession over an angular range of a few milliradian can suppress this confounding contrast by one-to-two orders of magnitude. Our exploration centres around a case study of GaAs near the [011] zone-axis orientation using a probe-forming aperture semiangle on the order of 0.1 mrad at 300 keV, but the trends found and methodology used are expected to apply more generally.
Comments: 12 pages, 9 figures, submitted to Ultramicroscopy
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:2002.01595 [cond-mat.mtrl-sci]
  (or arXiv:2002.01595v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Thomas Mawson [view email]
[v1] Wed, 5 Feb 2020 01:07:01 GMT (4102kb,D)

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