Title: Demonstration of Electric Double Layer Gating under High Pressure by the Development of Field-Effect Diamond Anvil Cell

Abstract: We have developed an EDLT-DAC that enables us to control the carrier density in the various materials even under high pressure by a novel combination of an electric double layer transistor (EDLT) and a diamond anvil cell (DAC). In this study, this novel EDLTDAC was applied to a Bi thin film, and here we report the first field-effect under high pressure in the material to our knowledge. Our EDLT-DAC is a promising device for exploring new physical phenomena such as high transition-temperature superconductivity.