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Condensed Matter > Materials Science

Title: A contamination-free electron-transparent metallic sample preparation method for MEMS experiments with in situ S/TEM

Abstract: Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron-microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron-microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.
Comments: Preprint submitted to Microscopy and Microanalysis
Subjects: Materials Science (cond-mat.mtrl-sci); Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
Journal reference: https://www.mdpi.com/1996-1944/14/5/1085
DOI: 10.3390/ma14051085
Cite as: arXiv:2012.02941 [cond-mat.mtrl-sci]
  (or arXiv:2012.02941v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Matheus Araujo Tunes Dr. [view email]
[v1] Sat, 5 Dec 2020 03:44:19 GMT (1149kb)

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