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Physics > Applied Physics

Title: Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization

Abstract: High-throughput grain mapping with sub-nanometer spatial resolution is demonstrated using scanning nanobeam electron diffraction (also known as 4D scanning transmission electron microscopy, or 4D-STEM) combined with high-speed direct electron detection. An electron probe size down to 0.5 nm in diameter is implemented and the sample investigated is a gold-palladium nanoparticle catalyst. Computational analysis of the 4D-STEM data sets is performed using a disk registration algorithm to identify the diffraction peaks followed by feature learning to map the individual grains. Two unsupervised feature learning techniques are compared: Principal component analysis (PCA) and non-negative matrix factorization (NNMF). The characteristics of the PCA versus NNMF output are compared and the potential of the 4D-STEM approach for statistical analysis of grain orientations at high spatial resolution is discussed.
Subjects: Applied Physics (physics.app-ph); Materials Science (cond-mat.mtrl-sci)
DOI: 10.1017/S1431927621011946
Cite as: arXiv:2103.07076 [physics.app-ph]
  (or arXiv:2103.07076v1 [physics.app-ph] for this version)

Submission history

From: Frances Allen [view email]
[v1] Fri, 12 Mar 2021 04:20:47 GMT (10159kb,D)

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