We gratefully acknowledge support from
the Simons Foundation and member institutions.
Full-text links:

Download:

Current browse context:

eess.SP

Change to browse by:

References & Citations

Bookmark

(what is this?)
CiteULike logo BibSonomy logo Mendeley logo del.icio.us logo Digg logo Reddit logo ScienceWISE logo

Electrical Engineering and Systems Science > Signal Processing

Title: A Self-Regulated and Reconfigurable CMOS Physically Unclonable Function Featuring Zero-Overhead Stabilization

Abstract: This article presents a reconfigurable physically unclonable function (PUF) design fabricated using 65-nm CMOS technology. A subthreshold-inverter-based static PUF cell achieves 0.3% native bit error rate (BER) at 0.062-fJ per bit core energy efficiency. A flexible, native transistor-based voltage regulation scheme achieves low-overhead supply regulation with 6-mV/V line sensitivity, making the PUF resistant against voltage variations. Additionally, the PUF cell is designed to be reconfigurable with no area overhead, which enables stabilization without redundancy on chip. Thanks to the highly stable and self-regulated PUF cell and the zero-overhead stabilization scheme, a 0.00182% native BER is obtained after reconfiguration. The proposed design shows 0.12%/10 {\deg}C and 0.057%/0.1-V bit error across the military-grade temperature range from -55 {\deg}C to 125 {\deg}C and supply voltage variation from 0.7 to 1.4 V. The total energy per bit is 15.3 fJ. Furthermore, the unstable bits can be detected by sweeping the body bias instead of temperature during enrollment, thereby significantly reducing the testing costs. Last but not least, the prototype exhibits almost ideal uniqueness and randomness, with a mean inter-die Hamming distance (HD) of 0.4998 and a 1020x inter-/intra-die HD separation. It also passes both NIST 800-22 and 800-90B randomness tests.
Comments: This work has been accepted by 2020 IEEE Journal of Solid-State Circuits (JSSC)
Subjects: Signal Processing (eess.SP); Cryptography and Security (cs.CR)
Journal reference: IEEE Journal of Solid-State Circuits (JSSC), Volume: 55, Issue: 1, Pages: 98-107, Jan. 2020
DOI: 10.1109/JSSC.2019.2938133
Cite as: arXiv:2107.06183 [eess.SP]
  (or arXiv:2107.06183v1 [eess.SP] for this version)

Submission history

From: Kaiyuan Yang [view email]
[v1] Wed, 7 Jul 2021 03:10:07 GMT (1144kb)

Link back to: arXiv, form interface, contact.