Title: Stringent and efficient assessment of Boson-Sampling devices

Abstract: Boson-Sampling holds the potential to experimentally falsify the Extended Church Turing thesis. The computational hardness of Boson-Sampling, however, complicates the certification that an experimental device yields correct results in the regime in which it outmatches classical computers. We demonstrate the shortcomings of current protocols, which are bypassed by a model with randomly prepared independent particles. An alternative test based on Fourier matrices is shown to permit more stringent certification for arbitrarily many particles.