Title: Scalable extraction of error models from the output of error detection circuits

Abstract: Accurate methods of assessing the performance of quantum gates are extremely important. Quantum process tomography and randomized benchmarking are the current favored methods. Quantum process tomography gives detailed information, but significant approximations must be made to reduce this information to a form quantum error correction simulations can use. Randomized benchmarking typically outputs just a single number, the fidelity, giving no information on the structure of errors during the gate. Neither method is optimized to assess gate performance within an error detection circuit, where gates will be actually used in a large-scale quantum computer. Specifically, the important issues of error composition and error propagation lie outside the scope of both methods. We present a fast, simple, and scalable method of obtaining exactly the information required to perform effective quantum error correction from the output of continuously running error detection circuits, enabling accurate prediction of large-scale behavior.