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Statistics > Applications

Title: Robust estimation based on one-shot device test data under log-normal lifetimes

Authors: N. Balakrishnan, E. Castilla
(Submitted on 3 Nov 2022)
Abstract: In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a simulation study and two numerical examples.
Subjects: Applications (stat.AP)
Cite as: arXiv:2211.02118 [stat.AP]
  (or arXiv:2211.02118v1 [stat.AP] for this version)

Submission history

From: Elena Castilla [view email]
[v1] Thu, 3 Nov 2022 19:45:29 GMT (161kb,D)
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