Title: Fidelity decay and error accumulation in quantum volume circuits

Abstract: We provide a comprehensive analysis of fidelity decay and error accumulation in faulty quantum circuit models. We devise an analytical bound to the average fidelity between the desired and faulty output states, accounting for errors that may arise during the implementation of two-qubit gates and multi-qubit permutations. We demonstrate that fidelity decays exponentially with both the number of qubits and circuit depth, and determine the decay rates as a function of the parameterized probabilities of the two types of errors. These decay constants are intricately linked to the connectivity and dimensionality of the processor's architecture. Furthermore, we establish a robust linear relationship between fidelity and the heavy output frequency used in Quantum Volume tests to benchmark quantum processors, under the considered errors protocol. These findings pave the way for predicting fidelity trends in the presence of specific errors and offer insights into the best strategies for increasing Quantum Volume.