References & Citations
Condensed Matter > Materials Science
Title: Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As
(Submitted on 6 Nov 2003 (v1), last revised 4 Jan 2004 (this version, v2))
Abstract: We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga[1-x]Mn[x]As films using polarized neutron reflectometry. In addition to increasing total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.
Submission history
From: Brian Kirby [view email][v1] Thu, 6 Nov 2003 00:32:55 GMT (304kb)
[v2] Sun, 4 Jan 2004 22:57:02 GMT (283kb)
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