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Condensed Matter > Statistical Mechanics

Title: Coarsening Dynamics of Crystalline Thin Films

Abstract: The formation of pyramid-like structures in thin-film growth on substrates with a quadratic symmetry, e.g., {001} surfaces, is shown to exhibit anisotropic scaling as there exist two length scales with different time dependences. Analytical and numerical results indicate that for most realizations coarsening of mounds is described by an exponent n=0.2357. However, depending on material parameters, n may lie between 0 (logarithmic coarsening) and 1/3. In contrast, growth on substrates with triangular symmetries ({111} surfaces) is dominated by a single length scale and an exponent n=1/3.
Comments: RevTeX, 4 pages, 3 figures
Subjects: Statistical Mechanics (cond-mat.stat-mech); Materials Science (cond-mat.mtrl-sci)
DOI: 10.1103/PhysRevLett.81.5481
Report number: SFU-Phys-siegert-1
Cite as: arXiv:cond-mat/9808119 [cond-mat.stat-mech]
  (or arXiv:cond-mat/9808119v1 [cond-mat.stat-mech] for this version)

Submission history

From: Martin Siegert [view email]
[v1] Wed, 12 Aug 1998 00:11:06 GMT (33kb)

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