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Condensed Matter > Materials Science

Title: Anisotropy of Resonant Inelastic X-Ray Scattering at the K Edge of Si:Theoretical Analysis

Abstract: We investigate theoretically the resonant inelastic x-ray scattering (RIXS) at the $K$ edge of Si on the basis of an ab initio calculation. We calculate the RIXS spectra with systematically varying transfered-momenta, incident-photon energy and incident-photon polarization. We confirm the anisotropy of the experimental spectra by Y. Ma {\it et al}. (Phys. Rev. Lett. 74, 478 (1995)), providing a quantitative explanation of the spectra.
Comments: 18 pages, 11 figures
Subjects: Materials Science (cond-mat.mtrl-sci)
Journal reference: J. Phys. Soc. Jpn. 73, 3171-3176(2004)
DOI: 10.1143/JPSJ.73.3171
Cite as: arXiv:cond-mat/0405009 [cond-mat.mtrl-sci]
  (or arXiv:cond-mat/0405009v4 [cond-mat.mtrl-sci] for this version)

Submission history

From: Yunori Nisikawa [view email]
[v1] Sat, 1 May 2004 12:02:09 GMT (116kb)
[v2] Wed, 16 Jun 2004 08:35:38 GMT (117kb)
[v3] Sat, 28 Aug 2004 09:30:35 GMT (141kb)
[v4] Tue, 18 Apr 2006 04:05:14 GMT (141kb)

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